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University of Hawaii

Electrical Engineering

Expanding Product Test to Drive Quality and Reliability

Date: 2019-09-25           Add to Google Calendar
Time: 6:30pm - 8:00pm
Location: Holmes Hall 244
Speaker: Ken Harris, Senior Director for Product Management, PDF Solutions, Inc.

Sponsored by the IEEE Hawaii jointed Electron Device Society & Solid State Circuit Chapter, and the University of Hawaii IEEE Student Branch

Abstract

Rapidly growing market segments such as automotive and the IoT are driving the manufacturing of billions of connected devices around the globe. Both trends are driving enormous change for how companies collect and analyze their data to achieve product insights that improve performance, quality and reliability. As a result, the future of product test can no longer be limited primarily to test operations, and needs to be expanded to encompass both manufacturing and field usage data.

With the enormous computing power available today, the opportunities to apply AI and machine learning to broader and more comprehensive data sets will open up many new avenues for the electronics supply chain to drive quality to the levels needed for mission-critical systems such as autonomous driving. In addition, novel test structures embedded into silicon devices will become more commonplace as companies seek out new ways to identify reliability signatures faster and earlier at every phase of the product lifecycle, reducing early life failures and improving predictive maintenance approaches.

This presentation will share how semiconductor and AI/ML technologies are creating innovative solutions that are dramatically changing the future of the test landscape for the benefit of the entire electronics ecosystem.



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