David G. Garmire, Ph.D.

 

Assistant Professor of Electrical Engineering

Office: 444 Holmes Hall

 

Research Interests

Micro/nano/bioelectromechanical Systems (M/N/BEMS)

CAD and Metrology for M/N/BEMS

Computer Vision

Computational Biology

 

"Strive after less tainted perfection, let it be aided by penetrating insight. So wipe and cleanse your vision of the mystery until all is without blur."
             Dao De Jing

 

 

 

Resume -- Available upon request (1 page)

 

Curriculum Vitae -- Available upon request (5 pages)

 

Teaching Statement — Available upon request

 

Research Statement — Available upon request

 

Fellowships

 

Siebel Scholars Fellowship Recipient. September 2006 - Summer 2007.

 

University of California Microelectronics Fellowship. Fall 2001 - Spring 2002.

 

Awards

 

UC Berkeley Management of Technology Certificate. June 2007

 

Sevin Rosen Funds Award for Innovation. May 2007.

 

Hong Kong University of Science and Technology International Business Plan Competition. 1st Place. (1st/150). May 2007.

 

University of San Francisco International Business Plan Competition. Finalist (top 5/85). April 2007.

 

Jungle Business Plan Challenge. Finalist (top 8/100). April 2007.

 

UC Berkeley Business Plan Competition. Semifinalist. 2007

 

Berkeley Nanotechnology Opportunity Challenge, Winner. November 2006 and February 2007. David Garmire and Hyuck Choo, “Microscanner Technology for Low-Cost High-Definition Displays and Biomedical Applications”

Three venture capitalists and two professors joined the Berkeley Nanotechnology Club in judging presentations of competitors from across the Berkeley and Stanford campuses.

 

Berkeley Sensor and Actuator Center (BSAC) Best Presentation Award. September 2006. Selected by attending industry members of the BSAC Industrial Advisory Board

        Topic: MEMS Electrometrology

 

News Articles

 

Wade Roush. “Guiding Eye for MEMS” for MIT Technology Review, Nov. 14th, 2006.

 

David Pescovitz. “Mighty Microscanner” for Lab Notes: Research from the College of Engineering, University of California, Berkeley.  September 2006.

 

Patents

 

D. Garmire, H. Choo, R. S. Muller, S. Govindjee, and J. Demmel, "Integrated MEMS Metrology Device using Complementary Measuring Combs," 2006. (pending)

 

H. Choo, D. Garmire, J. Demmel, R. S. Muller, and R. Kant, "MEMS-Based Phase-Shifting Interferometer," 2006. (pending)

 

H. Choo, D. Garmire, J. Demmel, and R. S. Muller, "CMOS-Compatible High-Performance Microscanners, Including Structures, High-Yield Simplified Fabrication Methods and Applications," 2005. (pending)

 

Publications

 

[1] L. X. Garmire, D. G. Garmire, C. A. Hunt. “An In Silico Transwell Device for the Study of Drug Transport and Drug-Drug Interactions.” Pharmaceutical Research. Online first. August 2007.

 

[2] H. Choo, D. Garmire, J. Demmel, and R. S. Muller. “Simple Fabrication Process for Self-Aligned, High-Performance Microscanners; Demonstrated Use to Generate a Two-Dimensional Ablation Pattern.” Journal of Microelectromechanical Systems, Vol. 16, No. 2, April 2007.

 

[3] D. Garmire, H. Choo, R. Kant, S. Govindjee, C. Sιquin, R. S. Muller, J. Demmel. “Diamagnetically Levitated MEMS Accelerometers.” Transducers 2007.

 

[4] H. Choo, R. Kant, D. Garmire, J. Demmel, and R. S. Muller. “Fast, MEMS-Based, Phase-Shifting Interferometer.” Solid-State Sensor and Actuator Workshop, June 4-8, 2006, pp.94-95, Hilton Head, SC (Late News Oral Presentation)

 

[5] D. Garmire, H. Choo, R. S. Muller, S. Govindjee, and J. Demmel. "MEMS Process Characterization with an on-Chip Device." Nanotech 2006, The Technical Proceedings of the Nano Science and Technology Institute, Vol. 3, pp. 550-553, Boston, MA, May 2006.

 

[6] D. Garmire, H. Choo, R. S. Muller, S. Govindjee and J. Demmel. "Device for in situ Electronic Characterization of MEMS Applicable to Conducting Structural Materials." Material Research Symposium Spring Meeting, April 2006, San Francisco, CA. Oral Presentation

 

[7] D. Garmire, R. S. Muller, J. Demmel. "Vision-based Teleoperation of a Stroboscopic Microscopic Interferometric System for Remote Dynamic MEMS Testing." IEEE/LEOS International Conference on Optical MEMS 2005 and Their Applications, Technical Digest pp. 163-164, Oulu Finland, August 2005. Unofficial version with better quality

 

[8] H. Choo, D. Garmire, J. Demmel, and R. S. Muller. "A Simple Process to Fabricate Self-Aligned High-Performance, Torsional Microscanners: Demonstrated Use in a Two-Dimensional Scanner." 2005 IEEE/LEOS International Conference on Optical MEMS and Their Applications, Technical Digest pp.21-2, Oulu, Finland, August 2005.

 

[9] J. V. Clark, D. Garmire, M. Last, J. Demmel. "Practical Techniques for Measuring MEMS Properties." Nanotech 2004, The Technical Proceedings of the Nano Science and Technology Institute, Vol. 1, pp. 402-405, Boston, MA, March 2004.

 

Papers Submitted and Under Review

 

H. Choo, R. Kant, D. Garmire, J. Demmel, and R. S. Muller. “Fast, MEMS-Based, Phase-Shifting Interferometer.” Journal of Microelectromechanical Systems, 2007.

 

Papers in Preparation

 

D. Garmire et al. "MEMS Process Characterization with an on-Chip Device." Journal of Microelectromechanical Systems. (journal version of [5])